Instrument | Acronym | Material | Surface | Industrial Chemistry | Analytical Separations | Nondestructive Analysis |
---|---|---|---|---|---|---|
Carbon, Hydrogen, Nitrogen, Sulfur, Oxygen Analysis | X | X | ||||
Differential Scanning Calorimetry | DSC | X | ||||
Dimensional measurements: CMM, vision sys, micrometer, gauge block, etc. | X | |||||
Gas Chromatography | GC | X | X | |||
Gas Chromatography/ Mass Spectrometry | GC-MS | X | X | X | ||
Helium Pyncnometry | X | |||||
Inductively Coupled Plasma - Mass Spectrometry | ICP-MS | X | X | |||
Inductively Coupled Plasma-Atomic Emission Spectrometry | ICP-AES | X | X | |||
Infrared Spectroscopy - ATC, Microscopic, Reflection | FTIR | X | ||||
Ion Chromatography | IC | X | X | |||
Karl Fischer Titration | X | |||||
Liquid Penetrant Testing | X | |||||
Magnetic Particle | X | |||||
Optical Microscopy | X | X | ||||
Physical Testing: Torque, hardness, tensile, compression, conductivity, surface finish, contact angle, spring constant | X | X | ||||
Scanning Electron Microscopy - Energy Dispersive Spectrometry | SEM-EDS | X | ||||
Thermogravimetric Analysis | TGA | X | ||||
Thermomechanical Analysis | TMA | X | ||||
Ultraviolet/Visible Spectroscopy | UV/Vis | X | X | |||
Wavelength Dispersive X-ray Fluorescence Spectrometry | WDXRF | X | ||||
X-ray Diffraction | XRD | X | ||||
X-ray Radiography - Real time, Film | X | |||||
Accelerated Solvent Extraction | ASE | X | ||||
Total Carbon Analysis | X | |||||
Liquid Properties: Viscosity, pH, Conductivity, Surface Tension, Gel Time | X | |||||
Metallography | X | |||||
Contact Ultrasonic Testing | X |